Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu2Mo6S8 by an advanced electrochemical strain microscopy method
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Date
2021Author
Badur, Sebastian
Renz, Diemo
Cronau, Marvin
Göddenhenrich, Thomas
Dietzel, Dirk
Roling, Bernhard
Schirmeisen, André
Quotable link
http://dx.doi.org/10.22029/jlupub-6483Original publication in
Scientific reports 11 (2021), 1-8, 18133