Spectral Data for “Microscopic origin of near- and far-field contributions to tip-enhanced optical spectra of few-layer MoS2”
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Raman, PL, TERS and TEPL spectra for the publication K. Kroth, P. Klement, L. Chen, S. Chatterjee, and P. J. Klar “Microscopic origin of near- and far-field contributions to tip-enhanced optical spectra of few-layer MoS2”. The layer assignment can be taken from the optical images of the different MoS2 flakes in the “Optical_images_with_layer_assignment“ pdf. The data, sorted by TERS, TEPL, temperature dependent, laser-power dependent measurements, are available in a standard txt-format. The main measurement settings are included in the file names. A more detailed explanation of the file names and additional information about the measurement setup can be found in the corresponding “Setup” files. All PL spectra are response-corrected using a calibrated tungsten-halogen lamp (Oriel, spectral range 250-2400nm) as reference standard.