Statistiken für Supplemental Data for "Combination of optical emission spectroscopy and multivariate data analysis techniques as a versatile non-invasive tool for characterizing xenon/krypton mixed gas plasma inside operating ion thrusters" (Part 1)

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Supplemental Data for "Combination of optical emission spectroscopy and multivariate data analysis techniques as a versatile non-invasive tool for characterizing xenon/krypton mixed gas plasma inside operating ion thrusters" (Part 1) 5

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Source data_Xe-Kr-plasma-OES.xlsx 3
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