Statistiken für Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu2Mo6S8 by an advanced electrochemical strain microscopy method
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| Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu2Mo6S8 by an advanced electrochemical strain microscopy method | 9 |
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| 10.1038_s41598-021-96602-2.pdf | 29 |
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