• Policy
    • FAQ JLUdocs
    • FAQ JLUdata
    • Publishing in JLUdocs
    • Publishing in JLUdata
    • Publishing Contract
    • English
    • Deutsch
View Item 
  •   JLUpub Home
  • JLUdata
  • Forschungsdaten
  • View Item
  •   JLUpub Home
  • JLUdata
  • Forschungsdaten
  • View Item
  • Info
    • Policy
    • FAQ JLUdocs
    • FAQ JLUdata
    • Publishing in JLUdocs
    • Publishing in JLUdata
    • Publishing Contract
  • English 
    • English
    • Deutsch
  • Login
JavaScript is disabled for your browser. Some features of this site may not work without it.

Supplemental Data Part 2 for 'Combination of optical emission spectroscopy and multivariate data analysis techniques as a versatile non-invasive tool for characterizing xenon/krypton mixed gas plasma inside operating ion thrusters'

Thumbnail
Files in this item
Source data_Kr-plasma-OES.xlsx (3.550Mb)
Source data_Kr-plasma-OES.zip (6.383Mb)
Date
2021-11-22
Author
Nauschütt, Benny Thierry
Further Contributors
Chen, Limei
Holste, Kristof
Klar, Peter J
Metadata
Show full item record
BibTeX Export
Quotable link
http://dx.doi.org/10.22029/jlupub-300
Abstract
Contains the source data of the extended krypton measurements used for the publication "Combination of optical emission spectroscopy and multivariate data analysis techniques as a versatile non-invasive tool for characterizing xenon/krypton mixed gas plasma inside operating ion thrusters" including all Langmuir probe and spectra measurements as well as calibration measurements for gas flow controllers and spectrometer. The evaluated data can be seen in the "Source data_Kr-plasma-OES.xlsx".
Linked publications or data sets
10.22029/jlupub-234
Collections
  • Forschungsdaten

Contact Us | Impressum | Privacy Policy | OAI-PMH
 

 

Browse

All of JLUpubCommunities & CollectionsOrganisational UnitDDC-ClassificationPublication TypeAuthorsBy Issue DateThis CollectionOrganisational UnitDDC-ClassificationPublication TypeAuthorsBy Issue Date

My Account

LoginRegister

Statistics

View Usage Statistics

Contact Us | Impressum | Privacy Policy | OAI-PMH