Supplemental Data for "Combination of optical emission spectroscopy and multivariate data analysis techniques as a versatile non-invasive tool for characterizing xenon/krypton mixed gas plasma inside operating ion thrusters" (Part 1)
Date
Authors
Nauschütt, Benny Thierry
Advisors/Reviewers
Further Contributors
Chen, Limei
Holste, Kristof
Klar, Peter J
Contributing Institutions
Publisher
Journal Title
Journal ISSN
Volume Title
Publisher
Quotable link
DOI:
http://dx.doi.org/10.22029/jlupub-234