Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu2Mo6S8 by an advanced electrochemical strain microscopy method
Dateien zu dieser Ressource
Datum
2021Autor
Badur, Sebastian
Renz, Diemo
Cronau, Marvin
Göddenhenrich, Thomas
Dietzel, Dirk
Roling, Bernhard
Schirmeisen, André
Zitierlink
http://dx.doi.org/10.22029/jlupub-6483Erstpublikation in
Scientific reports 11 (2021), 1-8, 18133